AMCASH has provided support to determine defects in industrial components. Using a Scanning Electron Microscope (SEM) with much higher magnification than an optical microscope, we can carry out analysis of fracture surfaces, for example to determine the cause of failure in components.
AMCASH offers two chemical analysis techniques: X-ray Fluorescence (XRF) and Energy Dispersive X-Ray Spectroscopy (EDS). XRF measures the chemical composition of macroscopic samples, while inclusions as small as 1 µm can be analysed, using EDS in conjunction with SEM.
Our mechanical performance evaluation facilities range from nano, micro to macro scales, from modern nanotechnology devices to traditional metallurgical engineering components.Visit our contact page for more information about AMCASH and how we can help your business with FREE technical assistance.